The following text field will produce suggestions that follow it as you type.

Barnes and Noble

Helium Ion Microscopy

Unfortunately, this item is no longer available, but we found some similar items you might like.
Helium Nano-bubble Formation in Tungsten: Measurement with Grazing-Incidence Small Angle X-ray Scattering
Barnes and Noble

Helium Nano-bubble Formation in Tungsten: Measurement with Grazing-Incidence Small Angle X-ray Scattering

From Barnes and Noble
Scanning Ion Conductance Microscopy
Barnes and Noble

Scanning Ion Conductance Microscopy

From Barnes and Noble
Volume Microscopy: Multiscale Imaging with Photons, Electrons, and Ions
Barnes and Noble

Volume Microscopy: Multiscale Imaging with Photons, Electrons, and Ions

From Barnes and Noble
Helium: The Disappearing Element
Barnes and Noble

Helium: The Disappearing Element

From Barnes and Noble
Excitations in Liquid and Solid Helium
Barnes and Noble

Excitations in Liquid and Solid Helium

From Barnes and Noble
Electrons and Electron Microscopy: Quantum Microscopy Introduction
Barnes and Noble

Electrons and Electron Microscopy: Quantum Microscopy Introduction

From Barnes and Noble
Helium: Characteristics, Compounds, and Applications
Barnes and Noble

Helium: Characteristics, Compounds, and Applications

From Barnes and Noble
Heavy Ion Reactions at Low Energies
Barnes and Noble

Heavy Ion Reactions at Low Energies

From Barnes and Noble
Electron Microscopy in Mineralogy
Barnes and Noble

Electron Microscopy in Mineralogy

From Barnes and Noble
Reflection High-Energy Electron Diffraction
Barnes and Noble

Reflection High-Energy Electron Diffraction

From Barnes and Noble
Electron Microscopy Science and Engineering
Barnes and Noble

Electron Microscopy Science and Engineering

From Barnes and Noble
Ion Mobility Spectrometry
Barnes and Noble

Ion Mobility Spectrometry

From Barnes and Noble
Atom Probe Microscopy / Edition 1
Barnes and Noble

Atom Probe Microscopy / Edition 1

From Barnes and Noble
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
Barnes and Noble

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

From Barnes and Noble
High-pressure Molecular Spectroscopy
Barnes and Noble

High-pressure Molecular Spectroscopy

From Barnes and Noble
Analytical Electron Microscopy for Materials Science
Barnes and Noble

Analytical Electron Microscopy for Materials Science

From Barnes and Noble
Powered by Adeptmind