The following text field will produce suggestions that follow it as you type.

Home

Barnes and Noble

Applied Scanning Probe Methods VI: Characterization

Unfortunately, this item is no longer available, but we found some similar items you might like.

You May Also Like

Handbook of Materials Characterization
Loading Inventory...
Barnes and Noble

Handbook of Materials Characterization

Current price: $249.99
From Barnes and Noble
Remote Sensing for Site Characterization
Loading Inventory...
Barnes and Noble

Remote Sensing for Site Characterization

Current price: $120.00
From Barnes and Noble
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Loading Inventory...
Barnes and Noble

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Current price: $144.10
From Barnes and Noble
Powered by Adeptmind