The following text field will produce suggestions that follow it as you type.

Home

Barnes and Noble

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard / Edition 1

Unfortunately, this item is no longer available, but we found some similar items you might like.

You May Also Like

Fast Analytical Techniques for Electrical and Electronic Circuits
Loading Inventory...
Barnes and Noble

Fast Analytical Techniques for Electrical and Electronic Circuits

Current price: $94.00
From Barnes and Noble
Digital System Test and Testable Design: Using HDL Models Architectures
Loading Inventory...
Barnes and Noble

Digital System Test and Testable Design: Using HDL Models Architectures

Current price: $119.99
From Barnes and Noble
Analog Circuits: Concepts, Devices and Systems
Loading Inventory...
Barnes and Noble

Analog Circuits: Concepts, Devices and Systems

Current price: $129.99
From Barnes and Noble
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Loading Inventory...
Barnes and Noble

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Current price: $144.10
From Barnes and Noble
Analog MOS Integrated Circuits for Signal Processing
Loading Inventory...
Barnes and Noble

Analog MOS Integrated Circuits for Signal Processing

Current price: $325.95
From Barnes and Noble
Powered by Adeptmind