The following text field will produce suggestions that follow it as you type.

Barnes and Noble

Test Generation of Crosstalk Delay Faults in VLSI Circuits

Unfortunately, this item is no longer available, but we found some similar items you might like.
A Unified Approach for Timing Verification and Delay Fault Testing / Edition 1

A Unified Approach for Timing Verification and Delay Fault Testing / Edition 1

Barnes and Noble
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Barnes and Noble
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits / Edition 2

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits / Edition 2

Barnes and Noble
Multi-Level Simulation for VLSI Design / Edition 1

Multi-Level Simulation for VLSI Design / Edition 1

Barnes and Noble
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits / Edition 1

Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits / Edition 1

Barnes and Noble
High-Performance Digital VLSI Circuit Design / Edition 1

High-Performance Digital VLSI Circuit Design / Edition 1

Barnes and Noble
Electrothermal Analysis of VLSI Systems

Electrothermal Analysis of VLSI Systems

Barnes and Noble
Hybrid Fault Tolerance Techniques to Detect Transient Faults Embedded Processors

Hybrid Fault Tolerance Techniques to Detect Transient Faults Embedded Processors

Barnes and Noble
VLSI Circuit Simulation and Optimization / Edition 1

VLSI Circuit Simulation and Optimization / Edition 1

Barnes and Noble
Analog VLSI Design Automation / Edition 1

Analog VLSI Design Automation / Edition 1

Barnes and Noble
Basic VLSI Design Technology: Technical Questions and Solutions

Basic VLSI Design Technology: Technical Questions and Solutions

Barnes and Noble
Hardware Design and Simulation in VAL/VHDL

Hardware Design and Simulation in VAL/VHDL

Barnes and Noble
Oscillation-Based Test Mixed-Signal Circuits

Oscillation-Based Test Mixed-Signal Circuits

Barnes and Noble
VLSI and Post-CMOS Electronics: Design, modelling and simulation

VLSI and Post-CMOS Electronics: Design, modelling and simulation

Barnes and Noble
Design Automation for Timing-Driven Layout Synthesis

Design Automation for Timing-Driven Layout Synthesis

Barnes and Noble
Algorithms for VLSI Physical Design Automation

Algorithms for VLSI Physical Design Automation

Barnes and Noble
Powered by Adeptmind