The following text field will produce suggestions that follow it as you type.

Home

Barnes and Noble

Reliability and Failure Analysis of High-Power LED Packaging

Unfortunately, this item is no longer available, but we found some similar items you might like.

You May Also Like

Organic and Inorganic Light Emitting Diodes: Reliability Issues Performance Enhancement

Organic and Inorganic Light Emitting Diodes: Reliability Issues Performance Enhancement

Barnes and Noble
Risk and Failure Analysis for Improved Performance and Reliability

Risk and Failure Analysis for Improved Performance and Reliability

Barnes and Noble
Power Electronic Packaging: Design, Assembly Process, Reliability and Modeling / Edition 1

Power Electronic Packaging: Design, Assembly Process, Reliability and Modeling / Edition 1

Barnes and Noble
Manufacturing Challenges in Electronic Packaging

Manufacturing Challenges in Electronic Packaging

Barnes and Noble
Microelectronic Reliability

Microelectronic Reliability

Barnes and Noble
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems / Edition 1

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems / Edition 1

Barnes and Noble
Reliability and Failure of Electronic Materials and Devices / Edition 2

Reliability and Failure of Electronic Materials and Devices / Edition 2

Barnes and Noble
Structural Integrity and Reliability in Electronics: Enhancing Performance in a Lead-Free Environment

Structural Integrity and Reliability in Electronics: Enhancing Performance in a Lead-Free Environment

Barnes and Noble
Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules

Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules

Barnes and Noble
High-Frequency Characterization of Electronic Packaging / Edition 1

High-Frequency Characterization of Electronic Packaging / Edition 1

Barnes and Noble
Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms

Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms

Barnes and Noble
Interconnect Reliability Advanced Memory Device Packaging

Interconnect Reliability Advanced Memory Device Packaging

Barnes and Noble
Hermeticity Testing of MEMS and Microelectronic Packages

Hermeticity Testing of MEMS and Microelectronic Packages

Barnes and Noble
Lead-Free Solder Interconnect Reliability

Lead-Free Solder Interconnect Reliability

Barnes and Noble
Freeform Optics for LED Packages and Applications / Edition 1

Freeform Optics for LED Packages and Applications / Edition 1

Barnes and Noble
Reliability of Power Electronic Converter Systems

Reliability of Power Electronic Converter Systems

Barnes and Noble
Powered by Adeptmind