The following text field will produce suggestions that follow it as you type.

Home

Barnes and Noble

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Unfortunately, this item is no longer available, but we found some similar items you might like.

You May Also Like

Fundamentals of Reliability Engineering: Applications in Multistage Interconnection Networks / Edition 1

Fundamentals of Reliability Engineering: Applications in Multistage Interconnection Networks / Edition 1

Barnes and Noble
Microelectronic Reliability

Microelectronic Reliability

Barnes and Noble
Reliability of Microtechnology: Interconnects, Devices and Systems

Reliability of Microtechnology: Interconnects, Devices and Systems

Barnes and Noble
Lead-Free Solder Interconnect Reliability

Lead-Free Solder Interconnect Reliability

Barnes and Noble
Reliability Assessment Using Stochastic Finite Element Analysis / Edition 1

Reliability Assessment Using Stochastic Finite Element Analysis / Edition 1

Barnes and Noble
Electrothermal Analysis of VLSI Systems

Electrothermal Analysis of VLSI Systems

Barnes and Noble
Optimal Reliability Design: Fundamentals and Applications

Optimal Reliability Design: Fundamentals and Applications

Barnes and Noble
Long-Term Strength of Materials: Reliability Assessment and Lifetime Prediction Engineering Structures

Long-Term Strength of Materials: Reliability Assessment and Lifetime Prediction Engineering Structures

Barnes and Noble
Graphene and VLSI Interconnects

Graphene and VLSI Interconnects

Barnes and Noble
Finite Elements in Civil Engineering Applications

Finite Elements in Civil Engineering Applications

Barnes and Noble
Lifeline Engineering Systems: Network Reliability Analysis and Aseismic Design

Lifeline Engineering Systems: Network Reliability Analysis and Aseismic Design

Barnes and Noble
VLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects

VLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects

Barnes and Noble
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs / Edition 1

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs / Edition 1

Barnes and Noble
Interfacial Compatibility Microelectronics: Moving Away from the Trial and Error Approach

Interfacial Compatibility Microelectronics: Moving Away from the Trial and Error Approach

Barnes and Noble
Engineering Finite Element Analysis

Engineering Finite Element Analysis

Barnes and Noble
Technology Computer Aided Design: Simulation for VLSI MOSFET / Edition 1

Technology Computer Aided Design: Simulation for VLSI MOSFET / Edition 1

Barnes and Noble
Powered by Adeptmind